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Design and fabrication of in-situ X-ray diffractometer in Phase- II beam line at IUACin Phase- II beam line at IUAC

Materials Science Group, Inter-University Accelerator Centre, New Delhi
○Pawan K Kulriya Fouran Singh Yogendra Y Mishra Amit Kumar R Ahuja Ashok Kothri R N Dutt Ambuj Tripathi D K Avasthi

The X-ray diffraction (XRD) techniques are highly used in studies of phase transformation, surface/Interface modification, i on beam induced epitaxial crystallization, nano phase synthesis and modification. The XRD (Model D8 Advance) was acquired from Bruker AXS German and installed in the phase-II beam line at Inter-University Accelerator Centre (IUAC), New Delhi, India. To design an in-situ XRD, a vacuum chamber was fabricated at workshop of the IUAC. This XRD chamber consists of two window, sealed with Kapton foil, for incident and reflected X-rays. The electropolished chamber is pumped by a turbo molecular pump and a vacuum of 5x10^-5 torr was obtained. Two beam pipes were fabricated and electropolished. The XRD chamber was interfaced to the beam line using two gate valves and a bellow. The alignment of the sample holder to the beam line was done using a theodolite. A lifting mechanism system that can lift the vacuum chamber up to a height of 200 mm, was fabricated. To avoid any damage of the x-ray tube and detector, two SS guide rods are provided. The in-situ testing of XRD was done by using 90MeV Ni beam with a 15 UD Pelletron Accelerator at IUAC. The in-situ XRD monitoring of the growth of the Au nano particles was undertaken. It was observed that the particle size increases as the fluence increases from 1x10¹³ to 1x10¹⁴ ions/cm².