BL-11B Soft X-Ray Double-Crystal Monochromator Station
Spokesperson :Yoshinori KITAJIMA
5641(PHS:4279)
yoshinori.kitajima@kek.jp
1. Outline
BL-11B provides soft X rays in the energy range between 1.8 keV and 3.9 keV with a double-crystal monochromator from a bending-magnet source. As there are no Be windows in the optical path, BL-11B is suitable for EXAFS measurements of light elements such as Si, P, S, and Cl. There is another station BL-2A for a similar energy region, which can provide soft X rays with higher resolving power and higher flux density from an undulator source.
Fig. 1: Optics of BL-11B.
2. Performance
| Optics | Focusing Mirror/Double-Crystal Monochromator [Ge(111) or InSb(111)]/(Refocusing Mirror) |
|---|
| Energy Range | 2020 eV - 3911 eV [Ge(111)] or 1764 eV - 3415 eV [InSb(111)] |
|---|
| Resolving Power | E/dE = ~2000 [Ge(111)] or ~1200 [InSb(111)] |
|---|
| Spot Size | ~ 7 mm (H) x 2 mm (V) |
|---|
| Photon Flux | maximum ~1011 photons/s |
|---|
Fig. 2: Spectral distribution from Ge(111) monochromator.
Fig. 3: Example EXAFS spectrum of a Si wafer.
3. Equipments
- Personal computer for monochromator control [NEC PC-9801VX41 (MS-DOS) with 3.5"FDD(2HD)]
- Software for monochromator control and XAFS measurements (MS-FORTRAN; similar to other XAFS stations at PF)
- Photon intensity monitor system (mesh and pico-Ammeter)
- Stages for vacuum chambers (2.2 m x 1.4 m, 1.3 m x 1.0 m)
- Simple vacuum chamber for total electron/fluorescence yield XAFS measurements of bulk materials
4. Remarks
- BL-11B does not have own vacuum chambers other than a simple one stated above, so that most users should bring one. Many of experimental apparatuses of PF can be connected. Please contact the spokesperson for each apparatus.
- Sample chamber should be evacuated to < 10-5 Torr.
- Beam is ca. 1.55 m above the floor level but ca. 1.2 m from the above-mentioned stages at sample position.
5. References
- T. Ohta et al., Nucl. Instrum. Methods A246, 373(1986).
- M. Funabashi et al., Rev. Sci. Instrum. 60, 1983(1989).
- Y. Kitajima, J. Elec. Spec. Relat. Phenom. 80, 405 (1996).
6. Publications
List of publications those registered to PF publication database is available.
Last modified: March 28, 2005.