Filters for fluorescent XAFS experiments

 

Here, the candidates of filters for fluorescent XAFS experiments and the filters equipped at each experimental station are listed. The filter is used in order to minimize the scattering signal detected by a fluorescent XAFS detector while passing through the fluorescence signal. Although it is effective in some cases, the fluorescence from the filter itself is also detected by the detector. Especially the K beta fluorescence from the filter cannot be separated from the K alpha emitted by the sample even if an SSD is used. It can be minimized by using dispersive slit properly.

 

Candidates of filters for each absorption edge.
List of filters equipped at each station

  


Table 1. Candidates of filters for each absorption edge.

target elements

E(K-edge)/eV

E(K alpha)/eV

candidates of filters

K

3607.8

3313.8

 

Ca

4038.1

3691.7

 

Sc

4489

4090.6

 

Ti

4964.5

4510.8

 

V

5463.9

4952.2

Ti

Cr

5988.5

5414.7

V

Mn

6537.6

5898.8

Cr

Fe

7111.2

6403.8

Mn

Co

7709.5

6930.3

Fe

Ni

8331.7

7478.2

Co

Cu

8980.3

8047.8

Ni

Zn

9660.7

8638.9

Cu

Ga

10368.2

9251.7

Zn

Ge

11103.6

9886.4

Ga

As

11865

10543.7

Ge

Se

12654.5

11222.4

As

Br

13470

11924.2

Se

Kr

14324.4

12649

Se, Br

Rb

15202.3

13395.3

Br, Kr

Sr

16107

14165.0

Kr, Rb

Y

17038

14958.4

Rb, Sr

Zr

17998.9

15775.1

Sr, Y

Nb

18986.9

16615.1

Y, Zr

Mo

20003.9

17479.3

Zr, Nb

Tc

21047.3

18367.1

Nb, Mo

Ru

22119.3

19279.2

Mo, Tc

Rh

23219.8

20216.1

Tc, Ru

Pd

24348

21177.1

Ru, Rh

Ag

25516.5

22162.9

Rh, Pd

Cd

26715.9

23173.6

Rh, Pd, Ag

In

27942.0

24209.7

Pd, Ag, Cd

Sn

29194.7

25271.3

Ag, Cd, In

Sb

30486.0

26359.1

Cd, In, Sn

Te

31811.4

27201.7

In, Sn, Sb

 


updated on Oct. 28, 2006, Jan. 9, 2002, Sep. 13, 1999

 

masaharu.nomura@kek.jp