Detail of beamline is described in "PF-XAFS Website"

Techniques

XAFS(X-ray Absorption Fine Structure)

  • Energy range: 2.1 - 15 keV (2.1 - 5 keV with Mirror)
  • Transmission mode: QXAFS
  • Fluorescent mode: Single-SDD

XRD

  • Goniomater 2θ: 0 - 90 deg.

Other experimental with monochromatized X-ray

  • Please contact us before experiment

Light source

PF Insersion Device SGU#15

  • Ring energy: 2.5 GeV
  • Max. current: 450 mA (Usually Top-up operation)
  • Critical energy: 4 keV
  • Horizontal acceptance: 0.2 mrad

Beamline optics

Monochromator

  • Si(111) Liquid LN2-cooled double crystal
  • Energy range: 2.1 - 15 keV
  • Numerical-drive (Toyama system)

Focusing system

for Horizontal
  • Bent flat mirror (Rh coated)
  • Double 16-element Bimorph mirror (Rh coated)
for Vertical
  • Bent flat mirror (Rh coated)
  • Standard beam size: 0.02H x 0.02V mm

Others

  • Double flat morror (Ni coated) for higher harmonics reduction

Performance

Focused and Monochromatized mode

  • Energy range: 2.1 - 15 keV*
    *2.1 - 5 keV with higher harmonics reduction mirror
  • Energy resolution: ΔE/E～2×10-4
  • Photon flux at sample position: 3.5x1011 phs/s (7.5 keV)

Experimantal station

Experimental hutch

  • Hatch size: 3.2L x 4.0W x 3.0H m
  • Door size: 2.0W x 2.4H m

Standard setup

  • Flat table size: 1200L x 800W mm
  • XAFS setup: Ionization chumber, SDD
  • XRD setup: Goniometer, PILATUS 100k

Beamline staff

Beamline manager

  • 武市 泰男 / TAKEICHI Yasuo (KEK-PF)
    yasuo.takeichi[@]kek.jp

Sub manager

  • 仁谷 浩明 / NITANI Hiroaki (KEK-PF)
    hiroaki.nitani[@]kek.jp
  • 松岡 亜衣 / MATSUOKA Ai (KEK-PF)
    ai.kamijo[@]kek.jp