Detail of beamline is described in "PF-XAFS Website"

Techniques

XAFS(X-ray Absorption Fine Structure)

  • Energy range: White X-ray or 5 - 25 keV
  • Transmission mode: Ionization chamber
  • Fluorescent mode: Lytle detector

Time-resolved XAFS (DXAFS)

  • Transmission mode with polychromator
  • Photo diode array detector
  • Si-microstrip detector (XSTRIP)

XRD

  • Equipment for XRD is maintained by user group (TITECH)

Other experimental with white or monochromatized X-ray

  • Please contact us before experiment

Light source

PF-AR Insertion device ID#2

  • Ring energy: 6.5 GeV
  • Max. current: 60 mA (Not Top-up operation)
  • Critical energy: 26.3 keV
  • Horizontal acceptance: 1 mrad(H) / 0.2mrad(V)
  • Tapered mode available

Beamline optics

Monochromator

  • Si(111) Liquid N2-cooled double crystal
  • Energy range: 5 - 25 keV
  • Numerical-drive (Kohzu system)

Focusing system

  • Bent cylinder mirror (Rh coated)
  • Bent flat mirror (Rh coated)
  • Standard beam size: 0.6H x 0.2V mm

Performance

Focused and Monochromatized mode

  • Energy range: 5 - 25 keV
  • Energy resolution: ΔE/E～2×10-4
  • Photon flux at sample position: 6x1012 phs/s (12 keV)

White X-ray mode

Experimantal station

Experimental hutch

  • Hatch size: 3.0L x 3.8W x 3.0H m
  • Door size: 2.6W x 2.4H m

Standard setup

  • XAFS setup: Ionization chumber
  • DXAFS setup: Polychromator, PDA detector
  • XRD setup: Goniometer

Beamline staff

Beamline manager

  • 丹羽 尉博 NIWA Yasuhiro (KEK-PF)
    yasuhiro.niwa[@]kek.jp

Sub manager

  • 阿部 仁 / ABE Hitoshi (KEK-PF)
    hitoshi.abe[@]kek.jp
  • 森 丈晴 / MORI Takeharu (KEK-PF)
    takeharu.mori[@]kek.jp
  • 仁谷 浩明 / NITANI Hiroaki (KEK-PF)
    hiroaki.nitani[@]kek.jp